The invention of the scanning tunnelling microscope, in 1982 resulted in the emergence of a whole new category of microscopic techniques. All these techniques fall under the family of probe microscopy, which basically involves the interaction of a sample with the sharp tip of a probe at distances of the order of a few μm to a few nm. The atomic force microscope (AFM) is one such scanning probe microscope that builds an image that describes the surface topology of a sample based on the atomic forces of interaction between the tip of the probe and the sample surface. ...
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